Low-cost embedded architecture for repeatable time control in electronic test stations
| Audiencia | Público en general | es_ES |
| Cobertura | México | es_ES |
| Fecha de ingreso | 2026-10-05T16:32:13Z | |
| Fecha de publicación | 2026-01-01 | |
| Resumen | . - Automation of electronic test stations is often constrained by manual timing control, which introduces operator-dependent variability, extended cycle durations, and increased rework. This study presents a low-cost embedded system for automated and repeatable time control in electronic test stations, designed to ensure consistent cycle termination, integrated visual feedback, and automatic power disconnection. The proposed architecture is based on a microcontroller platform implemented with widely available components to guarantee simplicity and scalability. The system was technically characterized to evaluate timing accuracy, repeatability, and actuation consistency under real industrial conditions. Experimental results obtained from 120 test cycles over a four-week period show stable cycle-to-cycle behavior, with a mean cycle time of 30.02 min, a standard deviation of 0.03 min, and a maximum absolute timing error below 0.08 min relative to the programmed duration. Operational validation showed a reduction in out-of-time events from 20\% to 4\%, as well as decreases in rework frequency and station downtime. The results indicate that the proposed system provides consistent and repeatable timing control at the minute scale, reducing operator-dependent variability while maintaining lower complexity and cost than conventional industrial automation platforms. | es_ES |
| Doi | https://doi.org/10.36561/ing.30.15 | es_ES |
| URI | https://riuat.uat.edu.mx/handle/123456789/4065 | |
| Idioma | en | es_ES |
| Editorial | UNIV MONTEVIDEO, FAC INGENIERIA | es_ES |
| Relación | Memoria Investigaciones en Ingenieria | es_ES |
| URL relacionado | https://doi.org/10.36561/ing.30.15 | es_ES |
| Derechos | Acceso abierto (Metadatos de producción científica) | es_ES |
| Licencia | http://purl.org/coar/access_right/c_abf2 | es_ES |
| Fuente | Memoria Investigaciones en Ingenieria | |
| Palabra clave | Repeatable time control | es_ES |
| Palabra clave | Embedded systems | es_ES |
| Palabra clave | Electronic test stations | es_ES |
| Palabra clave | Industrial automation | es_ES |
| Palabra clave | Low-cost systems | es_ES |
| Título | Low-cost embedded architecture for repeatable time control in electronic test stations | es_ES |
| Tipo | Artículo | es_ES |
| Arbitrado | Ha sido Arbitrado | es_ES |
| Autor | Crespo-Torres, Emiliano | |
| Autor | Dominguez-Cruz, Rene Fernando | |
| Autor | Garza-Alvarado, Leopoldo Asael | |
| Autor | Zamora-Gonzalez, Pedro Eden | |
| Autor | Fuentes-Rubio, Yadira Aracely | |
| Autor | Crespo-Torres, Emiliano | es_ES |
| Autor | Dominguez-Cruz, Rene Fernando | es_ES |
| Autor | Garza-Alvarado, Leopoldo Asael | es_ES |
| Autor | Zamora-Gonzalez, Pedro Eden | es_ES |
| Autor | Fuentes-Rubio, Yadira Aracely | es_ES |
| Institución | Universidad Autónoma de Tamaulipas | |
| Institución | Universidad Autónoma de Tamaulipas | es_ES |
| Número | 30 | es_ES |
| Rango de páginas | 229-243 | es_ES |
| URL relacionada | https://doi.org/10.36561/ing.30.15 | |
| Tipo de artículo | Indexado | |
| Tipo de artículo | Indexado | es_ES |